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Extending the analysis of EELS spectrum-imaging data, from elemental to bond mapping in complex nanostructures

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Publication Type:

Journal Article

Authors:

Arenal, R.; de La Pena, F.; Stéphan, Odile; Walls, Michael; Tence, M.; Loiseau, A.; Colliex, Christian

Source:

Ultramicroscopy, Volume 109, Number 1, p.32–38 (2008)