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Mapping titanium and tin oxide phases using EELS: An application of independent component analysis

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Publication Type:

Journal Article

Authors:

de La Pena, F.; Berger, M. H.; Hochepied, J. F.; Dynys, F.; Stéphan, Odile; Walls, Michael

Source:

Ultramicroscopy, Volume 111, Number 2, p.169–176 (2011)