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Role of point and line defects on the electronic structure of LaAlO 3 /SrTiO 3 interfaces

Posted in

Publication Type:

Journal Article

Authors:

Gloter, Alexandre; Tieri, Giulio; Li, Danfeng; Caputo, Marco; Strocov, Vladimir N.; Stéphan, Odile; Triscone, Jean-Marc; Gariglio, Stefano

Source:

APL Materials, Volume 8, Issue 4, p.041103 (2020)

DOI:

10.1063/1.5132376