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Depth Profiling Charge Accumulation from a Ferroelectric into a Doped Mott Insulator

Posted in

Publication Type:

Journal Article

Authors:

Marinova, Maya; Rault, Julien E.; Gloter, Alexandre; Nemsak, Slavomir; Palsson, Gunnar K.; Rueff, Jean-Pascal; Fadley, Charles S.; Carrétéro, Cécile; Yamada, Hiroyuki; March, Katia; Garcia, Vincent; Fusil, Stéphane; Barthélémy, Agnès; Stéphan, Odile; Colliex, Christian; Bibes, Manuel

Source:

Nano Letters, Volume 15, Issue 4, p.2533 - 2541 (2015)

DOI:

10.1021/acs.nanolett.5b00104