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Fast reconstruction of atomic-scale STEM-EELS images from sparse sampling

Posted in

Publication Type:

Journal Article

Authors:

Monier, Etienne; Oberlin, Thomas; Brun, Nathalie; Li, Xiaoyan; Tencé, Marcel; Dobigeon, Nicolas

Source:

Ultramicroscopy, Volume 215, p.112993 (2020)

URL:

https://arxiv.org/pdf/2002.01225.pdf

DOI:

10.1016/j.ultramic.2020.112993