Skip to main content

Relativistic effects in electron-energy-loss-spectroscopy observations of the Si/SiO2 interface plasmon peak

Posted in

Publication Type:

Journal Article

Authors:

Moreau, P.; Brun, Nathalie; Walsh, C. A.; Colliex, Christian; Howie, A.

Source:

Physical Review B, American Physical Soc, Volume 56, Number 11, p.6774–6781 (1997)