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Spatially resolved EELS fine structures at a SiO2/TiO2 interface

Posted in

Publication Type:

Journal Article

Authors:

Brun, Nathalie; Colliex, Christian; Rivory, J.; YuZhang, K.

Source:

Microscopy Microanalysis Microstructures, Editions Physique, Volume 7, Number 3, p.161–174 (1996)